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UID:DSC-22980
DTSTART;TZID=Europe/Berlin:20260825T130000
SEQUENCE:1786253768
TRANSP:OPAQUE
DTEND;TZID=Europe/Berlin:20260825T140000
URL:https://dresden-science-calendar.de/calendar/de/detail/22980
LOCATION:IFW\, Helmholtzstraße 2001069 Dresden
SUMMARY:Ledinsky: Universal Formation Mechanism of Halide Perovskite Thin F
 ilms
CLASS:PUBLIC
DESCRIPTION:Speaker: Dr. Martin Ledinsky\nInstitute of Speaker: Institute o
 f Physics of the Czech Academy of Sciences\, Cukrovarnicka 10\, 16200 Prag
 ue\, Czech Republ\nTopics:\n\n Location:\n  Name: IFW (D2E.27\, IFW Dresde
 n)\n  Street: Helmholtzstraße 20\n  City: 01069 Dresden\n  Phone: \n  Fax
 : \nDescription: Metal halide perovskites (MHPs) have gained significant s
 cientific interest due to their outstanding optoelectronic properties and 
 high efficiencies in solar cell photoconversion. There are many ways to pr
 epare MHPs of reasonable quality\, the solution process is still the best 
 in this manner. But the vacuum-based methods\, which are relevant for indu
 stry and large area deposition\, are not lacking far behind. The final pro
 duct is always the MHP thin film of similar morphology and structure. The 
 only substantial difference is the dimension of the grains\, which used to
  be larger for solution processed films. Therefore\, logical question aris
 es\, what are the differences in the MHP film formation? Recently\, with t
 he insight of in-situ photoluminescence (PL) and GIWAXS measurements\, we 
 have studied the MHP film deposition by solution processes.Based on the re
 sults depicted bellow\, we divided the MHPs growth into three stages. In s
 hort\, we see fast growth of MHPs grains from GIWAXS in the first growth s
 tage\, accompanied by proportional increase in PL signal. However\, in the
  second stage the growth speed significantly decreases\, and the PL signal
  is highly quenched. This observation means that the free grown grains (st
 age I) are of low defect densities\, but once they start to connect (stage
  II) the grain boundaries are formed\, where defects are concentrated. Thi
 s leads to rapid decrease of the PL signal. The last stage documents parti
 al degradation at long deposition times only. Surprisingly\, very similar 
 observation was done by in-situ measurement of evaporated MHPs and films p
 repared by pizza oven deposition. Preliminary results shows the same tende
 ncies for pulsed laser deposited MPHs as well. Deeper understanding to thi
 s universal formation mechanism of MPHs thin films give us a unique opport
 unity to enhance its optoelectronic quality. One critical aspect is format
 ion of large grains\, the second one is the passivation process mainly at 
 the grain boundaries. In-situ PL characterization is able to guide us thro
 ugh these processes.
DTSTAMP:20260809T100357Z
CREATED:20260611T053723Z
LAST-MODIFIED:20260809T053608Z
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