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DTSTART:19961027T030000
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UID:DSC-12530
DTSTART;TZID=Europe/Berlin:20170306T100000
SEQUENCE:1488786975
TRANSP:OPAQUE
DTEND;TZID=Europe/Berlin:20170306T111500
URL:https://dresden-science-calendar.de/calendar/en/detail/12530
LOCATION:HZDR\, Bautzner Landstraße 40001328 Dresden
SUMMARY:Jin: IEEE Distinguished Lecturer: The Hall effects Edwin Hall never
  imagined
CLASS:PUBLIC
DESCRIPTION:Speaker: Xiaofeng Jin\, Fudan University/China\nInstitute of Sp
 eaker: \nTopics:\nPhysik\n Location:\n  Name: HZDR (106/255 - Hörsaal)\n 
  Street: Bautzner Landstraße 400\n  City: 01328 Dresden\n  Phone: \n  Fax
 : \nDescription: Abstract:   The anomalous Hall effect (AHE) is one of the
  oldest and most prominent transport phenomena in magnetic materials. Howe
 ver\, the microscopic mechanism of the AHE has remained unresolved for mor
 e than a century because its rich phenomenology defies standard classifica
 tion\, prompting conflicting claims of the dominant processess. We differe
 ntiate these processes through temperature-dependent measurements on epita
 xial Fe\, Ni\, Co\, and NixCu1-x films of varying thickness [1]\, [2]. The
  results allow an unambiguous identification of both intrinsic and extrins
 ic mechanisms of the anomalous Hall effect. The more recently discovered s
 pin Hall effect (SHE) has attracted a great deal of attention because of i
 ts potential applications in spin current devices. Various methods have be
 en developed to generate and detect the SHE and search for materials with 
 large spin Hall angles. These efforts notwithstanding\, reliable and accur
 ate determination of spin Hall angle remains a challenge. In this lecture 
 I will first give a comprehensive discussion on the basic concepts of AHE 
 and SHE. Expoliting the attributes of epitaxial magnetic thin films\, I wi
 ll then explain how to control independenly the different scattering proce
 sses through temperature and layer thickness and to identifiy unambiguousl
 y the intrinsic and extrinsic mechanisms of the AHE. Finally\, based on th
 e understanding of the microscopic mechanisms of the AHE\, I will describe
  how we developed a new method using H-patterned films to measure quantiti
 es inherent in the SHE.  [1] Y. Tian\, L. Ye\, and X\, Jin\, “Proper sca
 ling of the anomalous Hall effect\,” Phys. Rev. Lett. 103\, 087206 (2009
 )\, doi : 10.1103/PhysRevLett.103.087206. [2] D.-Z. Hou\, G. Su\, Y. Tian\
 , X. Jin\, S. A. Yang\, and Q. Niu\, Phys. Rev. Lett. 114\, 217203 (2015)\
 , doi: 10.1103/PhysRevLett.114.217203.
DTSTAMP:20260720T202557Z
CREATED:20170216T074105Z
LAST-MODIFIED:20170306T075615Z
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