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UID:DSC-13906
DTSTART;TZID=Europe/Berlin:20171218T100000
SEQUENCE:1513583086
TRANSP:OPAQUE
DTEND;TZID=Europe/Berlin:20171218T110000
URL:https://dresden-science-calendar.de/calendar/en/detail/13906
LOCATION:IFW\, Helmholtzstraße 2001069 Dresden
SUMMARY:Christiansen: 3D nanoarchitectures for energy- and bio-medical tech
 nologies - enhanced functionality through correlative microscopy and spect
 roscopy
CLASS:PUBLIC
DESCRIPTION:Speaker: Prof. Dr.  Silke Christiansen\nInstitute of Speaker: H
 elmholtz-Zentrum Berlin für Materialien und Energie\nTopics:\nMaterialien
 \, Physik\n Location:\n  Name: IFW (Hörsaal\, IFW Dresden)\n  Street: Hel
 mholtzstraße 20\n  City: 01069 Dresden\n  Phone: \n  Fax: \nDescription: 
 The successful integration of 3D nano-architectures\, with scale-bridging 
 features from macro-to-nano\, into devices such as sensors or light emitte
 rs and absorbers e.g. light emitting diodes (LEDs) or solarcells requires 
 new approaches towards fabrication and characterization.   The present pap
 er will show the successful realization of device concepts relying on prop
 erty controlled Si or GaN nanowires (NWs) or inverted\, cone-shaped\, 1D S
 i structures (SiNCs) which permit the concentration and confinement of vis
 ible (VIS) and near infrared (NIR) light e.g. in whispering gallery modes 
 (WGMs). Fabrication concepts based on nano-lithography and dry etching and
  optical property optimization based on numerical simulations (finite diff
 erence time domain - FDTD) will be presented. Individual as well as ensemb
 les of these 1D nano-structures will be integrated in pn-junction solar ce
 lls (all-inorganic or organic-inorganic hybrids) and optical sensors. Desi
 gn rules for optimized absorption or light emission (VIS-NIR) will be deri
 ved. Moreover\, novel carrier selective\, nano-material based contacting s
 chemes will be presented. Among those\, composites containing silver nanow
 ires and graphene are demonstrated.   Materials and device characterizatio
 n will rely on advanced correlated electron microscopy (EM) and spectrosco
 py (CORRMIC) including optical\, electrical\, structural and compositional
  techniques inside scanning EMs and x-ray microscopes (XRMs). The impact o
 f statistical evaluation of heterogeneous CORRMIC data on materials and de
 vice optimization will be demonstrated.
DTSTAMP:20260521T123626Z
CREATED:20171214T075834Z
LAST-MODIFIED:20171218T074446Z
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