Simulation of electromigration lifetimes of copper interconnect segments
- Date
- Nov 4, 2011
- Time
- 11:00 AM - 12:00 PM
- Speaker
- Dr. Matthias Kraatz
- Affiliation
- BTU Cottbus, Angewandte Physik-Sensorik
- Language
- en
- Main Topic
- Materialien
- Other Topics
- Materialien, Physik
- Host
- Brit Präßler-Wüstling
Last modified: Nov 4, 2011, 8:35:05 AM
Location
Leibniz Institut für Festkörper- und Werkstoffforschung Dresden (B 3E.26, IFW Dresden, Helmholtzstraße 20)Helmholtzstraße2001069Dresden
- Homepage
- http://www.ifw-dresden.de
Organizer
Leibniz Institut für Festkörper- und Werkstoffforschung DresdenHelmholtzstraße2001069Dresden
- Homepage
- http://www.ifw-dresden.de
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